QM20-U-S Thin Film Thickness / Rate Monitor

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395

EDFelectronics offers so called PC based thickness rate monitors QM20 series, which combine the functionality of an oscillator and measurement converter. All monitors are installed between sensor head and superior control unit (e.g. PC or PLC) on atmosphere. The transducer delivers information about quartz frequency, with extremely high accuracy and temperature stability rate via a serial line like RS232, RS485, USB or PoE QM20 series are available with standard and high resolution. Read more info for detailed model description bellow.

 

 

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Description

QM20-U-S it is PC based thickness rate monitor with USB interface and standard resolution of 0.1 Hz, which combine the functionality of an oscillator and measurement converter. All monitors are installed between sensor head and superior control unit (e.g. PC or PLC) on atmosphere and are available with 2 inputs – one requires external oscylator – model QM-EO. The transducer delivers information about quartz frequency with extremely high accuracy and temperature stability rate via a serial USB port. All the other parameters are calculated and shown on included PC software

The following table provides an overview of available PC based monitors to compare:

QM20-x-S standard resolution

QM20

QM20-x-H high resolution

QM20

Interface: x=2: RS232
x=4: RS485
x=U: USB
x=E: Ethernet / PoE
x=2: RS232
x=4: RS485
x=U: USB
x=E: Ethernet / PoE
Resolution (@ 6MHz): 0.1 Hz 0.01 Hz
No of supported crystals 2 2

Additional information

Interface

USB

Resolution (@ 6MHz)

0.1 Hz

Basic frequency of operation

6 MHz

Inputs No.

2 – one built-in oscilator, 2nd suported with external oscilator

External oscillator support

Yes – (2) configuration via serial command

Windows® PC software

Included

USB cable length

3m ( included )

Downloads

Download necessary files

Instruction

X