QM20-4-H Thin Film Thickness / Rate Monitor

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*The promotion is valid until 31.12.2023

 

EDFelectronics offers so called PC based thickness rate monitors QM20 series, which combine the functionality of an oscillator and measurement converter. All monitors are installed between sensor head and superior control unit (e.g. PC or PLC) on atmosphere. The transducer delivers information about quartz frequency, rate, thickness and crystal health via a serial line like RS232, RS485, USB or PoE QM20 series are available with standard and high resolution.

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Description

QM20-4-H it is PC based thickness rate monitor with RS-485 interface and high resolution of 0.01 Hz, which combine the functionality of an oscillator and measurement converter. Unit is powered on by external power supply aded in standard. All monitors are installed between sensor head and superior control unit (e.g. PC or PLC) on atmosphere and are available with 2 inputs – one requires external oscylator – model QM-EO. The transducer delivers information about quartz frequency with extremely high accuracy and temperature stability rate via a serial RS-485 port. All the other parameters are calculated and shown in included PC software

The following table provides an overview of available PC based monitors to compare:

QM20-x-S standard resolution

QM20

QM20-x-H high resolution

QM20

Interface: x=2: RS232
x=4: RS485
x=U: USB
x=E: Ethernet / PoE
x=2: RS232
x=4: RS485
x=U: USB
x=E: Ethernet / PoE
Resolution (@ 6MHz): 0.1 Hz 0.01 Hz
No of supported crystals 2 2

Additional information

Interface

RS-485 2-wire

Resolution (@ 6MHz)

0.01 Hz

Frequency of operation

6 MHz

Inputs No.

2 ( One channel with internal Built-in oscylator only )

External oscillator support

Yes – one channel only

RS cable length

20m max (1.5 m included)

Software

Windows®

X